Abstract
This work presents a MePLER, an in-Memory cumulative distribution table (CDT) sampler, featuring custom cell derived from NAND-Type CAM for range-matching, pipelined and segmented array for reduced energy, and suppressed timing and power side-channel leakage. The precision and sample range are configurable for different sampling requirements. A 65nm prototype achieves constant 85.9-MSps, 1-sample/cycle throughput, 20.6-pJ/sample efficiency, and 0.03-mm2 footprint.
Type
Publication
2021 Symposium on VLSI Circuits
Dai Li
PhD 2021, now at Google
Yan He
PhD 2023, now at Nvidia
Akhil Pakala
MECE 2024, now at Apple
